Franta, Daniel: search on Z-Library

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1

Optical properties of rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry

Jan Mistrik, Tomuo Yamaguchi, Daniel Franta, Ivan Ohlidal, Gu Jin Hu, Ning Dai

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 112 KB

english, 2005

2

Ellipsometric characterisation of thin films non-uniform in thickness

David Nečas, Daniel Franta, Vilma Buršíková, Ivan Ohlídal

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 401 KB

english, 2011

3

Optical characterization of HfO2 thin films

Daniel Franta, Ivan Ohlídal, David Nečas, František Vižd'a, Ondřej Caha, Martin Hasoň, Pavel Pokorný

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 877 KB

english, 2011

4

Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry

Ohlídal, Ivan, Nečas, David, Franta, Daniel, Buršíková, Vilma

Journal:

Diamond and Related Materials

Year:

2009

Language:

english

File:

PDF, 346 KB

english, 2009

5

Optical properties of diamond-like carbon films containing SiOx

Franta, Daniel, Ohlı́dal, Ivan, Buršı́ková, Vilma, Zajı́čková, Lenka

Journal:

Diamond and Related Materials

Year:

2003

Language:

english

File:

PDF, 168 KB

english, 2003

6

SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Sunday 3 April 2016)] Optical Micro- and Nanometrology VI - Optical characterization of SiO 2 thin films using universal dispersion model over wide spectral range

Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang, Franta, Daniel, Nečas, David, Ohlídal, Ivan, Giglia, Angelo

Year:

2016

Language:

english

File:

PDF, 1.82 MB

english, 2016

7

Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models

Franta, Daniel, Nečas, David, Zajíčková, Lenka

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 440 KB

english, 2013

8

Erratum to “Optical properties of diamond-like carbon films containing SiOx”

Franta, Daniel, Ohlı́dal, Ivan, Buršı̂ková, Vilma, Zajı́čková, Lenka

Journal:

Diamond and Related Materials

Year:

2004

Language:

english

File:

PDF, 58 KB

english, 2004

9

Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry

Ivan Ohlídal, Miloslav Ohlídal, David Nečas, Daniel Franta, Vilma Buršíková

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 418 KB

english, 2011

10

Limitations and possible improvements of DLC dielectric response model based on parameterization of density of states

Franta, Daniel, Nečas, David, Zajíčková, Lenka, Buršíková, Vilma

Journal:

Diamond and Related Materials

Year:

2009

Language:

english

File:

PDF, 557 KB

english, 2009

11

Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range

Franta, Daniel, Nečas, David, Zajíčková, Lenka, Buršíková, Vilma, Cobet, Christoph

Journal:

Diamond and Related Materials

Year:

2010

Language:

english

File:

PDF, 1.04 MB

english, 2010

12

Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films

Franta, Daniel, Buršíková, Vilma, Ohlídal, Ivan, Sťahel, Pavel, Ohlídal, Miloslav, Nečas, David

Journal:

Diamond and Related Materials

Year:

2007

Language:

english

File:

PDF, 284 KB

english, 2007

13

Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture

Lenka Zajíčková, Daniel Franta, David Nečas, Vilma Buršíková, Mihai Muresan, Vratislav Peřina, Christoph Cobet

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 1.61 MB

english, 2011

14

Modeling of optical constants of diamond-like carbon

Franta, Daniel, Buršíková, Vilma, Nečas, David, Zajíčková, Lenka

Journal:

Diamond and Related Materials

Year:

2008

Language:

english

File:

PDF, 255 KB

english, 2008

15

Anisotropy-enhanced depolarization on transparent film/substrate system

Daniel Franta, David Nečas, Ivan Ohlídal

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 595 KB

english, 2011

16

Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry

Ohlídal, Ivan, Nečas, David, Buršíková, Vilma, Franta, Daniel, Ohlídal, Miloslav

Journal:

Diamond and Related Materials

Year:

2008

Language:

english

File:

PDF, 235 KB

english, 2008

17

Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions

Vohánka, Jiří, Nečas, David, Franta, Daniel

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2019

Language:

english

File:

PDF, 723 KB

english, 2019

18

Advanced modeling for optical characterization of amorphous hydrogenated silicon films

Franta, Daniel, Nečas, David, Zajíčková, Lenka, Ohlídal, Ivan, Stuchlík, Jiří

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 462 KB

english, 2013

19

Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model

Franta, Daniel, Čermák, Martin, Vohánka, Jiří, Ohlídal, Ivan

Journal:

Thin Solid Films

Year:

2017

Language:

english

File:

PDF, 1.75 MB

english, 2017

20

Improved combination of scalar diffraction theory and Rayleigh–Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces

Ohlídal, Ivan, Franta, Daniel, Nečas, David

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 480 KB

english, 2014

21

Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen

Franta, Daniel, Nečas, David, Zajíčková, Lenka, Ohlídal, Ivan

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 584 KB

english, 2014

22

Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films

Franta, Daniel, Buršíková, Vilma, Ohlídal, Ivan, Zajíčková, Lenka, St′ahel, Pavel

Journal:

Diamond and Related Materials

Year:

2005

Language:

english

File:

PDF, 212 KB

english, 2005

23

Influence of technological conditions on mechanical stresses inside diamond-like carbon films

Ohlídal, Ivan, Ohlídal, Miloslav, Franta, Daniel, Čudek, Vladimír, Buršíková, Vilma, Klapetek, Petr, Páleníková, Kateřina

Journal:

Diamond and Related Materials

Year:

2005

Language:

english

File:

PDF, 99 KB

english, 2005

24

Broadening of dielectric response and sum rule conservation

Franta, Daniel, Nečas, David, Zajíčková, Lenka, Ohlídal, Ivan

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 574 KB

english, 2014

25

Application of sum rule to the dispersion model of hydrogenated amorphous silicon

Franta, Daniel, Nečas, David, Zajíčková, Lenka, Ohlídal, Ivan, Stuchlík, Jiří, Chvostová, Dagmar

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 457 KB

english, 2013

26

Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry

Nečas, David, Ohlídal, Ivan, Franta, Daniel, Čudek, Vladimír, Ohlídal, Miloslav, Vodák, Jiří, Sládková, Lucia, Zajíčková, Lenka, Eliáš, Marek, Vižďa, František

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 811 KB

english, 2014

27

Optical properties of diamond-like carbon films containing SiOx studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry

Daniel Franta, Ivan Ohlı́dal, Vilma Buršı́ková, Lenka Zajı́čková

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 142 KB

english, 2004

28

Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films

Daniel Franta, David Nečas, Lenka Zajíčková, Vilma Buršíková, Christoph Cobet

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 612 KB

english, 2011

29

Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions

Vohánka, Jiří, Nečas, David, Franta, Daniel

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2019

File:

PDF, 723 KB

2019

30

Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry

VohÃ¡nka, JiÅÃ, Å ustek, Å tÄpÃ¡n, BurÅ¡ÃkovÃ¡, Vilma, Å klÃbovÃ¡, Veronika, Å ulc, VÃ¡clav, Homola, VojtÄch, Franta, Daniel, ÄermÃ¡k, Martin, OhlÃdal, Miloslav, OhlÃdal, Ivan

Journal:

Applied Surface Science

Year:

2020

File:

PDF, 2.91 MB

2020

31

SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films

Duparré, Angela, Geyl, Roland, Ohlídal, Miloslav, Ohlidal, Ivan, Nečas, David, Vodák, Jiří, Franta, Daniel, Nádaský, Pavel, Vižd'a, František

Year:

2015

Language:

english

File:

PDF, 734 KB

english, 2015

32

Optical characterization of ultrananocrystalline diamond films

Franta, Daniel, Zajíčková, Lenka, Karásková, Monika, Jašek, Ondřej, Nečas, David, Klapetek, Petr, Valtr, Miroslav

Journal:

Diamond and Related Materials

Year:

2008

Language:

english

File:

PDF, 354 KB

english, 2008

33

Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers

Ohlídal, Ivan, Vohánka, Jiří, Mistrík, Jan, Čermák, Martin, Franta, Daniel

Journal:

Surface and Interface Analysis

Year:

2018

Language:

english

File:

PDF, 334 KB

english, 2018

34

Optical characterization of thin films by the combined method of spectroscopic ellipsometry and spectroscopic photometry

Daniel Franta, Ivan Ohlídal, David Petrýdes

Journal:

Year:

2005

Language:

english

File:

PDF, 253 KB

english, 2005

35

Analysis of Slightly Rough Thin Films by Optical Methods and AFM

Franta, Daniel, Ohlídal, Ivan, Klapetek, Petr

Journal:

Microchimica Acta

Year:

2000

Language:

english

File:

PDF, 99 KB

english, 2000

36

Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films

Nečas, David, Franta, Daniel, Ohlídal, Ivan, Poruba, Aleš, Wostrý, Petr

Journal:

Surface and Interface Analysis

Year:

2013

Language:

english

File:

PDF, 510 KB

english, 2013

37

Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering

Ohlídal, Miloslav, Unĉovský, Marek, Ohlídal, Ivan, Franta, Daniel

Journal:

Journal of Modern Optics

Year:

1999

Language:

english

File:

PDF, 655 KB

english, 1999

38

SPIE Proceedings [SPIE 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics - Velke Losiny, Czech Republic (Tuesday 12 September 2000)] 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics - Calculation of the optical quantities characterizing inhomogeneous thin films using a new mathematical procedure based on the matrix formalism and Drude approximation

Franta, Daniel, Ohlidal, Ivan, Perina, Sr., Jan, Hrabovsky, Miroslav, Krepelka, Jaromir

Year:

2001

Language:

english

File:

PDF, 113 KB

english, 2001

39

Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride

Franta, Daniel, Nečas, David, Giglia, Angelo, Franta, Pavel, Ohlídal, Ivan

Journal:

Applied Surface Science

Year:

2016

Language:

english

File:

PDF, 2.02 MB

english, 2016

40

Amorphous gallium oxide grown by low-temperature PECVD

Kobayashi, Eiji, Boccard, Mathieu, Jeangros, Quentin, Rodkey, Nathan, Vresilovic, Daniel, Hessler-Wyser, Aïcha, Döbeli, Max, Franta, Daniel, De Wolf, Stefaan, Morales-Masis, Monica, Ballif, Christophe

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2018

Language:

english

File:

PDF, 3.77 MB

english, 2018

41

Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory

Čermák, Martin, Vohánka, Jiří, Ohlídal, Ivan, Franta, Daniel

Journal:

Journal of Modern Optics

Year:

2018

Language:

english

File:

PDF, 2.11 MB

english, 2018

42

Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges

Lenka Zajíčková, Vilma Buršíková, Daniel Franta, Angelique Bousquet, Agnes Granier, Antoine Goullet, Jiří Buršík

Journal:

Plasma Processes and Polymers

Year:

2007

Language:

english

File:

PDF, 285 KB

english, 2007

43

REAL-TIME ESTIMATION OF MEAN ARTERIAL BLOOD PRESSURE

Zanderigo, Eleonora, Leibundgut, Daniel, Kraus, Franta, Wymann, Rolf, Morari, Manfred

Journal:

IFAC Proceedings Volumes

Year:

2005

Language:

english

File:

PDF, 313 KB

english, 2005

44

Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects

Vohánka, Jiří, Ohlídal, Ivan, Ohlídal, Miloslav, Šustek, Štěpán, Čermák, Martin, Šulc, Václav, Vašina, Petr, Ženíšek, Jaroslav, Franta, Daniel

Journal:

Year:

2019

Language:

english

File:

PDF, 1.81 MB

english, 2019

45

Optical properties of NiO thin films prepared by pulsed laser deposition technique

Daniel Franta, Beatrice Negulescu, Luc Thomas, Pierre Richard Dahoo, Marcel Guyot, Ivan Ohlídal, Jan Mistrík, Tomuo Yamaguchi

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 186 KB

english, 2005

46

Influence of cross-correlation effects on the optical quantities of rough films

Franta, Daniel, Ohlídal, Ivan, Necas, David

Journal:

Year:

2008

Language:

english

File:

PDF, 332 KB

english, 2008

47

New insights into the machinery of blood digestion by ticks

Sojka, Daniel, Franta, Zdeněk, Horn, Martin, Caffrey, Conor R., Mareš, Michael, Kopáček, Petr

Journal:

Trends in Parasitology

Year:

2013

Language:

english

File:

PDF, 3.53 MB

english, 2013

48

Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers

Kotilainen, Minna, Krumpolec, Richard, Franta, Daniel, Souček, Pavel, Homola, Tomáš, Cameron, David C., Vuoristo, Petri

Journal:

Solar Energy Materials and Solar Cells

Year:

2017

Language:

english

File:

PDF, 1.81 MB

english, 2017

49

Modeling of dielectric response of GexSbyTez (GST) materials

Daniel Franta, David Necas, Miloslav Frumar

Journal:

physica status solidi (c)

Year:

2009

Language:

english

File:

PDF, 208 KB

english, 2009

50

Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy

Daniel Franta, Ivan Ohlídal, Petr Klapetek, Růžena Nepustilová, Svatopluk Bajer

Journal:

Surface and Interface Analysis

Year:

2006

Language:

english

File:

PDF, 268 KB

english, 2006

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